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  20 rezultate găsite pentru 1 săptămâmă , Microscoape electronice , Anunțurile curente
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Balayage Electron Microscope (Meb) Compatible With The Domain Of Microelectronics And To Be Installed In An Iso6 White Room Environment

Ţara:  Franţa

Tip: Cerere de oferte

$
Publicat
Mai 2, 2025
System Of Scanning Electron Microscope With Focused Ionic Bundle For Sampling For Tomography Atomography

Ţara:  Cehia

Tip: Cerere de oferte

Finanţator:   European Union

$
Publicat
Mai 2, 2025
Acquisition Of Direct Electron Detection Cameras For Installation On The Titan Themis Electron Microscope Of The Cisit Building From The University Of Lille

Ţara:  Franţa

Tip: Acordarea Contractului

$
Publicat
Mai 2, 2025
Procurement of Scanning Electron Microscope (SEM) for Laboratory Division.

Ţara:  Bangladesh

Tip: Cerere de oferte

Publicat
Mai 1, 2025
3D Lit-Obirch System (Imws-2.1) +Scanning Electron Microscope With Ultrafast E-Beam Operation (Imws-3.1 ) - Pr876527-2690-P

Ţara:  Germania

Tip: Cerere de oferte

Finanţator:   European Union

$
Publicat
Aprilie 30, 2025
Delivery Of High -Resistant Scanning Electron Microscope With An Eds Chemical Composition Analysis Detector

Ţara:  Polonia

Tip: Cerere de oferte

$
Publicat
Aprilie 30, 2025
Szp/242-090/2025 Delivery Of High -Resolution Of A Scanning Electron Microscope Dedicated To 3D Imaging - 1 Item For The Center For Materials Engineering And Plastic Machining. "

Ţara:  Polonia

Tip: Cerere de oferte

$
Publicat
Aprilie 30, 2025
Supply And Delivery Of Pharmaceutical Research Equipment For Armauer Hansen Research Institute (Ahri), Addis Ababa, Ethiopia

Ţara:  Etiopia

Tip: Cerere de oferte

Finanţator:   United Nations Office for Project Service (UNOPS)

$
Publicat
Aprilie 30, 2025
Invitation For Expression Of Interest For Eswatini

Ţara:  Statele Unite

Tip: Cerere de oferte

Finanţator:   Food and Agriculture Organization (FAO)

$
Publicat
Aprilie 30, 2025
Cap I & D No. 53 Aac Ciceco 02 24 - Acquisition Of 1 (One) Electronic Bench Microscope (Without) With Eds (Energy Dispersive Spectroscopy), For The Associated Ciceco - Insti ...

Ţara:  Portugalia

Tip: Acordarea Contractului

$
Publicat
Aprilie 29, 2025
Raith Electron-Beam Lithography Hardware And Software Upgrade

Ţara:  Irlanda

Tip: Acordarea Contractului

$
Publicat
Aprilie 29, 2025
Ads For Formalization Of Contracts Of: Presidency Of The State Agency Higher Council For Scientific Research, M.P. Object: Supply And Installation Of An Electronic Field Broadcasting Microscope With X -Ray Detector, Aimed At The Barcelona Microelectronics Institute Of The State Agency Higher Council For Scientific Research. File: 33126/25.

Ţara:  Spania

Tip: Acordarea Contractului

$
Publicat
Aprilie 29, 2025
Zakupa Laboratory And Medtskogo Oborudovania Purchase Of Medical And Laboratory Equipment

Ţara:  Tadjikistan

Tip: Cerere de oferte

$
Publicat
Aprilie 29, 2025
Supply Of An Electronic Microscope In Scanning

Ţara:  Franţa

Tip: Cerere de oferte

Finanţator:   European Union

$
Publicat
Aprilie 29, 2025
Notice Of Market Investigation To Verify Uniqueness Supplier Pursuant To Art. 76 C. 2 Lett. B) Of Legislative Decree No. 36/2023 - Supply Of An Electronic Microscope With Sem Scan

Ţara:  Italia

Tip: Procurement Plan

$
Publicat
Aprilie 29, 2025
Precise Ion Beam Based Trenching Tool (Imws-03.2) + High Performance Ga-Fib Sample Preparation (Imws-08.1) + High Performance Analyical Sem Inspection (Imws-08.2) - Pr924050-2690-P

Ţara:  Germania

Tip: Cerere de oferte

Finanţator:   European Union

$
Publicat
Aprilie 28, 2025
3D Lit-Obirch System (Imws-2.1) +Scanning Electron Microscope With Ultrafast E-Beam Operation (Imws-3.1 ) - Pr876527-2690-P

Ţara:  Germania

Tip: Cerere de oferte

Finanţator:   European Union

$
Publicat
Aprilie 28, 2025
Itq For Supply, Delivery, Installation, Testing And Commissioning Of One (1) Unit Of Semi-Motorized Fluorescence Inverted Microscope For The Department Of Chemical And Biomolecular Engineering

Ţara:  Singapore

Tip: Cerere de oferte

$
Publicat
Aprilie 28, 2025
Precise Ion Beam Based Trenching Tool (Imws-03.2) + High Performance Ga-Fib Sample Preparation (Imws-08.1) + High Performance Analyical Sem Inspection (Imws-08.2) (Pr924050-2690-P)

Ţara:  Germania

Tip: Cerere de oferte

$
Publicat
Aprilie 27, 2025
3D Lit-Obirch System (Imws-2.1) +Scanning Electron Microscope With Ultrafast E-Beam Operation (Imws-3.1 ) (Pr876527-2690-P)

Ţara:  Germania

Tip: Cerere de oferte

$
Publicat
Aprilie 27, 2025